Denmark – Scanning electron microscopes – The procurement of the Supply, Installation and Commissioning of a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with Gallium Ion Source
Open call for tenders published in the EU Official Journal. Closes in 32 days.
DTU requires the supply, delivery, installation, commissioning and acceptance of one (1) focused ion beam scanning electron microscope (FIB-SEM) dual-beam platform. The instrument shall serve a multi-user research environment and will be used for high-resolution surface imaging, site-specific cross-sectioning, TEM lamella preparation (including automated workflows), 3D FIB-SEM tomography, gas-assi
- Buyer
- Danmarks Tekniske Universitet - DTU
- Country
- Denmark
- Submission deadline
- 16 Nov 2026
- Contract type
- Supplies
- Sector (CPV)
- Laboratory, optical and precision equipment
- Main CPV code
- 38511100
- Place of performance
- DK012
- Published
- 2026-10-15
- TED reference
- 713490-2026
Read the official notice on TED →
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