Germany – Machines and apparatus for testing and measuring – Semi-Automatic Wafer Prober System for Characterization of 200-mm Wafers
Open call for tenders published in the EU Official Journal. Closes in 29 days.
The subject of the procurement is the supply, installation and commissioning of a semi-automatic wafer prober system for the electrical and high-frequency characterization of 200-mm wafers for research and laboratory use at IHP. The system shall include, among other components, a 200-mm wafer prober with vacuum chuck and precision positioning, individual probes, multi-contact probes for RF measure
- Buyer
- IHP GmbH - Lebniz-Institut für innovative Mikroelektronik
- Country
- Germany
- Submission deadline
- 29 Oct 2026
- Contract type
- Supplies
- Sector (CPV)
- Laboratory, optical and precision equipment
- Main CPV code
- 38540000
- Place of performance
- DE403
- Published
- 2026-09-29
- TED reference
- 670077-2026
Read the official notice on TED →
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