Germany – Machines and apparatus for testing and measuring – Semi-automatic prober for characterization of 200 mm wafers
Open call for tenders published in the EU Official Journal. Closes in 28 days.
Supply, delivery, installation, commissioning and integration of a semi-automatic wafer prober system for the electrical and temperature-dependent characterization of 200 mm wafers. The system shall support DC and pulsed I-V as well as low-frequency impedance measurements up to 10 MHz and shall be integrated with the existing Keithley 4200A-SCS characterization system. The scope includes the probe
- Buyer
- IHP GmbH - Leibniz-Institut für innovative Mikroelektronik
- Country
- Germany
- Submission deadline
- 13 Oct 2026
- Contract type
- Supplies
- Sector (CPV)
- Laboratory, optical and precision equipment
- Main CPV code
- 38540000
- Place of performance
- DE403
- Published
- 2026-09-14
- TED reference
- 631856-2026
Read the official notice on TED →
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